Automated X-Ray inspectionem (Axi) est a technology fundatur in eadem principiis ut automated optical inspectionem (aoi). Non utitur X radios sicut suum fontem, pro visibilis lux, ut automatice inspicere features, quae sunt typice occultatum a visu.
Automated X-Ray inspectionem est in amplis et industrias et applications, prehedominantly duo major proposita:
Processus Optimization, id est eventus ad inspectionem sunt ad optimize his processing gradus:
Anomaliam deprehendatur, id est propter inspectionem serve sicut criterium rejicere pars (quia exiguo vel re-opus).
Dum aoi est maxime consociata cum electronics vestibulum (ex multis usu in PCB vestibulum), axi habet multo latius range of applications. Rotae ex qualis reprehendo ex mixturis rotae ad palam os fragmenta in processionaliter cibum. Quocumque magnis numeris ex ipso simillima sunt produci secundum defined vexillum, automatic inspectionem usura provectus imaginem dispensando et exemplar recognition software (computatrum vision) habet utile ad dispensando et vestibulum.
Cum ad imaginem imaginis processus software numerus applications pro automated X-ray inspectionem ingens et constanter crescit. Primum applications coepi in industries ubi salus aspectus components postulavit diligenter inspectionem cuiusque partis produci (ut welding summis ad metallum partes in nuclei potentia statio), quia technology fuit, quia per technology fuit, quia per technology fuit, quia in principio erat. But with wider adoption of the technology, prices came down significantly and opened automated x-ray inspection up to a much wider field- partially fueled again by safety aspects (eg detection of metal, glass or other materials in processed food) or to increase yield and optimize processing (eg detection of size and location of holes in cheese to optimize slicing patterns).[IV]
In missa productionem complexum items (eg in electronics vestibulum), in mane deprehendatur defectus potest PRANUS reducere altiore sumptus, quod impedit defectiva partium ex esse in subsequent vestibulum vestigia. This results in three major benefits: a) it provides feedback at the earliest possible state that materials are defective or process parameters got out of control, b) it prevents adding value to components that are already defective and therefore reduces the overall cost of a defect, and c) it increases the likelihood of field defects of the final product, because the defect may not be detected at later stages in quality inspection or during functional testing due to the limited set of test Patterns.
Post tempus: Dec-28-2021